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The present study aims to investigate the optical and electrical characteristics of aluminum (Al)-coated zinc oxide thin films. The samples in this section were prepared with Sol-Gel method.Using Puma software, the film thickness is around 200 nm. The X-ray diffraction spectrum of these samples comprises three peaks owing to diffraction from plates (100), (002), and (101) associated with the creation of a hexagonal structure of zinc oxide, according to the results of characterization. Sample contamination reduces peak intensity (002) substantially. The resistivity of the synthesized films falls by a little quantity of impurity to a significant order, such that the sample's specific strength has a minimum impurity of roughly 2% and increases again with the addition of further impurities, according to these tests. With a minimal impurity of roughly 2%, the sample's specific strength increases and then decreases when more impurities are added. Furthermore, the adsorption edge of impurity-free samples is in the 370 nm wavelength region, which moves to lower energies as the number of impurities rises.
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